Silicon dioxide

Formulation

Use name:

Relevant for all uses

Reference

Name:

Silicon dioxide

Type of composition:

legal entity composition of the substance

State / form:

solid: nanoform

Reference substance:

Silicon dioxide

Type of information reported:

single nanoform

Name of nanoform:

Speroidal

Shape category:

spheroidal

Remarks:

ND and Z1, primary particle shape: 100% spherical particles with regular shape.

Shape:

spherical

Pure shape:

yes

Typical composition:

ca. 100 %

Range:

ca. 100 %

Shape category:

spheroidal

Remarks:

ND and Z1

Percentile:

D10

Typical value:

>= 1.2 nm

Range:

>= 0.5 - <= 10 nm

Percentile:

D50

Typical value:

>= 2.9 nm

Range:

>= 2 - <= 14 nm

Percentile:

D90

Typical value:

>= 11 nm

Range:

>= 5 - <= 40 nm

Additional information:

According to the TEM image and histogram, ND type Quartzene material’s particle dize varies between 1 to 20 nm where as the majority of the particles are below 10 nm in size.
As it can be seen from the TEM analysis, Z1 type Quartzene material’s particle size varies between 5 to 20 nm in the image and it should be mentioned that the analytical sample is an example of the Z1 particles on the TEM grid, different parts of the same gird may have different particles and the particle size can vary between 10 to 30 nm in size.

Fraction of constituent particles in the size range 1-100 nm:

>= 50 - <= 100 %

Structure:

amorphous

Name:

amorphous

Pure structure:

yes

Typical composition:

>= 99.7 %

Range:

>= 99.7 - <= 100 %

Crystal system:

not applicable

Description:

Z1 and ND is 100% amorphous (< 0,3 % crystalline parts). X-ray diffraction diagrams of ND/Z1 show only a broad halo, revealing an X-ray amorphous structure. The detection limit for crystallinity by X-ray is in the maximum order of 0.3% by weight or below. please see XRD-analysis for confirmation.

Typical specific surface area:

>= 279 m²/g

Range of specific surface area:

>= 122 - <= 556 m²/g

Surface treatment applied:

no